Dynamic speckle illumination microscopy with wavelet prefiltering.
نویسندگان
چکیده
Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.
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ورودعنوان ژورنال:
- Optics letters
دوره 32 11 شماره
صفحات -
تاریخ انتشار 2007